Experimental and numerical investigation of nanoparticle releasing in AFM nanomanipulation using high voltage electrostatic forces

HG Kashani and S Shokrolahi and HA Moayyer and MS Panahi and AS Zavareh, JOURNAL OF APPLIED PHYSICS, 122, 034305 (2017).

DOI: 10.1063/1.4995287

Atomic Force Microscopes (AFMs) have been widely used as nanomanipulators due to their versatility to work with a broad range of materials and their controllable interaction force, among other features. While AFMs can effectively grasp, move, and position nanoscale objects in 2D environments through basic pull/push operations, they often lack the high precision required in many 3D pick and place applications, especially in non-vacuum environments. In this study, a novel method to resolve the adhesion problem between nanoscale objects and the AFM tip has been developed and tested. The method is based on the application of a high electrostatic voltage to the tip to produce the repulsive force required for the release of the nanoobject. The method is proposed for conductive nanoparticles and tips used in many nanomanipulation applications, and can be easily implemented on typical AFMs with minimal alterations. The applicability of the proposed method is investigated through a series of combined Molecular Dynamics/Finite Element simulations. Published by AIP Publishing.

Return to Publications page