Full strain tensor measurements with X-ray diffraction and strain field mapping: a simulation study

MX Tang and JW Huang and YY Zhang and SN Luo, JOURNAL OF SYNCHROTRON RADIATION, 27, 646-652 (2020).

DOI: 10.1107/S1600577520003926

Strain tensor measurements are important for understanding elastic and plastic deformation, but full bulk strain tensor measurement techniques are still lacking, in particular for dynamic loading. Here, such a methodology is reported, combining imaging-based strain field mapping and simultaneous X-ray diffraction for four typical loading modes: one- dimensional strain/stress compression/tension. Strain field mapping resolves two in-plane principal strains, and X-ray diffraction analysis yields volumetric strain, and thus the out-of-plane principal strain. This methodology is validated against direct molecular dynamics simulations on nanocrystalline tantalum. This methodology can be implemented with simultaneous X-ray diffraction and digital image correlation in synchrotron radiation or free-electron laser experiments.

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