Molecular Modeling of Interfaces between Hole Transport and Active Layers in Flexible Organic Electronic Devices

R Bhowmik and RJ Berry and V Varshney and MF Durstock and BJ Leever, JOURNAL OF PHYSICAL CHEMISTRY C, 119, 27909-27918 (2015).

DOI: 10.1021/acs.jpcc.5b09765

Molecular modeling methods are used to understand the interfacial properties between the hole-transport and active layers in organic photovoltaic (OPV) devices. The hole-transport layer (HTL) consists of a blend of poly(styrene-sulfonate) and poly(3,4-ethylenedioxythiophene) (PEDOT:PSS), whereas the active layer (AL) consists of a blend of poly(3-hexylthiophene) and phenyl-C61-butyric acid methyl ester (P3HT:PCBM). Simulation results on the HTL confirm the interpenetrating lamellar structure with alternating PSS and PEDOT domains as observed in experiments. In addition, interfacial results show high PCBM interactions with the HTL, which result in PCBM migration to the HTL surface. The observed PCBM concentration profile is discussed from the perspective of attractive interactions, and it is shown that these interactions are governed by the side chain of PCBM. Calculations also suggest that OPV device performance could be improved by, for example, increasing the number of benzene rings and backbone -CH2- groups in the PCBM side chain, which would be expected to reduce PCBM concentration at the HTL surface. The results yield important insights into molecular interactions associated with the HTL and AL interfaces that contribute to final device morphology and thus provide guidelines toward materials design approaches for optimized device performance.

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