Shock-induced migration of Sigma 3 < 110 > grain boundaries in Cu

XJ Long and L Wang and B Li and J Zhu and SN Luo, JOURNAL OF APPLIED PHYSICS, 121, 045904 (2017).

DOI: 10.1063/1.4974958

Using molecular dynamics simulations, we systematically investigate shock-induced migration of a set of Sigma 3 < 110 > 70.53 degrees tilt grain boundaries in Cu, including coherent twin boundary, 15 asymmetric tilt grain boundaries (ATGBs), and symmetric incoherent twin boundary (SITB), with inclination angle (Phi) increasing from 0 degrees to 90 degrees. Grain boundary migration occurs only in ATGBs, via faceting for Phi <= 70.3 degrees and translation for Phi > 70.53 degrees (with the 9R phase). Migration magnitude increases with increasing Phi for ATGBs. Migration mode and magnitude depend on the grain boundary structure including SITB orientation and length fraction, and the symmetry of resolved shear stress distribution across a grain boundary. Published by AIP Publishing.

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